High-Speed Phase-Shifting Profilometry: Principles, Acceleration Strategies, and Future Research Trends

Document Type

Article

Publication Date

1-1-2026

Abstract

Phase-shifting profilometry (PSP) is a widely adopted technique in structured light (SL) 3-D measurement, known for its high precision and strong robustness against noise. As modern applications increasingly demand high-speed inspection, inline measurement, and real-time 3-D reconstruction, the community has devoted extensive efforts to accelerating PSP while maintaining its precision. Motivated by these developments and the growing need for a systematic understanding of recent progress, we provide a comprehensive review of relevant advancements in high-speed PSP. This review first outlines the fundamental principles of PSP, including geometric modeling and coordinate systems, image formation, phase-shifting (PS) mathematics, representative phase-unwrapping techniques, standard 3-D reconstruction procedures, as well as noise modeling and precision analysis. It then highlights recent advances in high-speed PSP, with emphasis on four major directions: 1) system-level acceleration enabled by mechanical and array projection and binary defocusing; 2) pattern-reduction strategies such as dual-frequency shifting, hybrid encoding, and temporal interleaving; 3) computational acceleration approaches using deep learning (DL) or other algorithmic methods; and 4) motion-induced error compensation techniques that mitigate interframe misalignment and phase distortion. Finally, this article discusses the key challenges facing high-speed PSP and outlines promising future research directions. Remarkably, nearly 70% of the cited literature was published within the past five years, aiming to capture the most recent developments, system-level innovations, and emerging trends in high-speed PSP, thereby emphasizing the timeliness and novelty of this survey.

Publication Title

IEEE Transactions on Instrumentation and Measurement

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