Extended sampling method for inverse electromagnetic scattering problems using a single incident wave
Document Type
Article
Publication Date
1-23-2026
Department
Department of Mathematical Sciences
Abstract
We consider the inverse electromagnetic problem to reconstruct an obstacle from the far-field data due to a single incident wave. It is shown that if two obstacles generate identical far-field patterns then they must intersect. Then we construct a novel far-field equation and prove the properties of its solutions, based on which we define an indicator function and propose an extended sampling method (ESM) for the location and support of the obstacle. The ESM is extremely simple to implement and has the ability to process limited aperture data. Numerical examples demonstrate the effectiveness of the method with little prior information and noisy data.
Publication Title
Inverse Problems
Recommended Citation
Liu, J.,
Yang, F.,
Yan, X.,
&
Sun, J.
(2026).
Extended sampling method for inverse electromagnetic scattering problems using a single incident wave.
Inverse Problems,
42(1).
http://doi.org/10.1088/1361-6420/ae3799
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p2/2686