Review of near-field optics and superlenses for sub-diffraction-limited nano-imaging
Document Type
Article
Publication Date
10-1-2016
Abstract
© 2016 Author(s). Near-field optics and superlenses for imaging beyond Abbe's diffraction limit are reviewed. A comprehensive and contemporary background is given on scanning near-field microscopy and superlensing. Attention is brought to recent research leveraging scanning near-field optical microscopy with superlenses for new nano-imaging capabilities. Future research directions are explored for realizing the goal of low-cost and high-performance sub-diffraction-limited imaging systems.
Publication Title
AIP Advances
Recommended Citation
Adams, W.,
Sadatgol, M.,
&
Güney, D.
(2016).
Review of near-field optics and superlenses for sub-diffraction-limited nano-imaging.
AIP Advances,
6(10).
http://doi.org/10.1063/1.4964498
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/9005
