Annealing of low-temperature GaAs studied using a variable energy positron beam
Document Type
Article
Publication Date
12-1-1993
Abstract
The annihilation characteristics of monoenergetic positrons implanted in a molecular beam epitaxy layer of low-temperature (LT) GaAs annealed at temperatures from 300 to 600°C were measured. A gallium vacancy concentration of approximately 3×1017 cm-3 is inferred for the as-grown material. The S parameter increased significantly upon anneal to 500°C. The dominant positron traps in samples annealed at and below 400°C are distinct from those acting for samples annealed to 500 or 600°C. The change in S parameter for the 600°C annealed sample compared to the GaAs substrate, SLT,600=1.047Ssub, is consistent with divacancies or larger open volume defects.
Publication Title
Applied Physics Letters
Recommended Citation
Keeble, D.,
Umlor, M.,
Asoka-Kumar, P.,
Lynn, K.,
&
Cooke, P.
(1993).
Annealing of low-temperature GaAs studied using a variable energy positron beam.
Applied Physics Letters,
63(1), 87-89.
http://doi.org/10.1063/1.109706
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/8798
