Atomic Force Microscopy for Characterization of Surfaces, Particles, and Their Interactions
Document Type
Article
Publication Date
2-2016
Department
Department of Materials Science and Engineering
Publication Title
Developments in Surface Contamination and Cleaning: Detection, Characterization, and Analysis of Contaminants
Recommended Citation
Etzler, F.,
&
Drelich, J.
(2016).
Atomic Force Microscopy for Characterization of Surfaces, Particles, and Their Interactions.
Developments in Surface Contamination and Cleaning: Detection, Characterization, and Analysis of Contaminants, 307-331.
http://doi.org/10.1016/B978-1-4377-7883-0.00006-7
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/5864
