Atomic Force Microscopy for Characterization of Surfaces, Particles, and Their Interactions

Authors

Frank M. Etzler, Lake Erie College of Osteopathic Medicine
Jaroslaw Drelich, Michigan Technological UniversityFollow

Document Type

Article

Publication Date

2-2016

Department

Department of Materials Science and Engineering

Publication Title

Developments in Surface Contamination and Cleaning: Detection, Characterization, and Analysis of Contaminants

Recommended Citation

Etzler, F., & Drelich, J. (2016). Atomic Force Microscopy for Characterization of Surfaces, Particles, and Their Interactions. Developments in Surface Contamination and Cleaning: Detection, Characterization, and Analysis of Contaminants, 307-331. http://doi.org/10.1016/B978-1-4377-7883-0.00006-7
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/5864