Discussion of "The migrational characteristics of the cusp-oriented α/k interface in the Cu-Si system"
Document Type
Article
Publication Date
1-1-1973
Department
Department of Materials Science and Engineering
Publication Title
Metallurgical Transactions
Recommended Citation
Kinsman, K.,
Eichen, E.,
&
Aaronson, H.
(1973).
Discussion of "The migrational characteristics of the cusp-oriented α/k interface in the Cu-Si system".
Metallurgical Transactions,
4(1), 369-370.
http://doi.org/10.1007/BF02649641
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/4423
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