Averaging effect on current-voltage characteristics of zno varistors
Document Type
Article
Publication Date
1-1-1995
Abstract
Surface electrode patterns with systematic changes of electrode gap distances and widths have been developed to investigate the averaging effect in the current-voltage (I-V) measurements of ZnO varistors. Varistor breakdown voltages, Vb, and the nonlinear exponent, a, were obtained from the I-V measurements. The a vs voltage plots showed multiple breakdown peaks when the gap distances were greater than 2.5 x the average grain diameter. A decrease in a due to the lower-voltage breakdowns was also observed. The same effect was obtained when single-junction I-V results were used in simulating the junction network on a computer. The broad distribution of grain size is considered as the main cause of multiple breakdowns. The small amount non-switching and short-circuited junctions also play an important role in the device I-V characteristics. © 1995 IOP Publishing Ltd.
Publication Title
Japanese Journal of Applied Physics
Recommended Citation
Wang, H.,
Schulze, W.,
&
Cordaro, J.
(1995).
Averaging effect on current-voltage characteristics of zno varistors.
Japanese Journal of Applied Physics,
34(5R), 2352-2358.
http://doi.org/10.1143/JJAP.34.2352
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/12458
