Title

In situ probing of electromechanical properties of an individual ZnO nanobelt

Authors

Anjana Asthana, Michigan Technological UniversityFollow
Kasra Momeni, Michigan Technological University
Abhishek Prasad, Michigan Technological University
Yoke Khin Yap, Michigan Technological UniversityFollow
Reza Shahbazian Yassar, Michigan Technological UniversityFollow

Document Type

Article

Publication Date

10-29-2009

Abstract

We report here, an investigation on electrical and structural-microstructural properties of an individual ZnO nanobelt via in situ transmission electron microscopy using an atomic force microscopy (AFM) system. The I-V characteristics of the ZnO nanobelt, just in contact with the AFM tip indicates the insulating behavior, however, it behaves like a semiconductor under applied stress. Analysis of the high resolution lattice images and the corresponding electron diffraction patterns shows that each ZnO nanobelt is a single crystalline, having wurtzite hexagonal structure (a=0.324 nm, c=0.520 66 nm) with a general growth direction of (1010).

Publisher's Statement

© 2009 American Institute of Physics. Publisher’s version of record: https://doi.org/10.1063/1.3241075

Publication Title

Applied Physics Letters

Recommended Citation

Asthana, A., Momeni, K., Prasad, A., Yap, Y. K., & Yassar, R. S. (2009). In situ probing of electromechanical properties of an individual ZnO nanobelt. Applied Physics Letters, 95, 172106. http://doi.org/10.1063/1.3241075
Retrieved from: https://digitalcommons.mtu.edu/physics-fp/299

Version

Publisher's PDF