Title
Monte Carlo simulation of dislocation-nucleated etching of silicon {111} surfaces
Document Type
Conference Paper/Presentation
Publication Date
Spring 1995
Abstract
We investigate equilibrium properties and thermal etching of the {111} surfaces of silicon, both with and without perpendicular intersecting dislocations, using Monte Carlo computer simulation. A modified solid-on-solid (SOS) approach is employed which realizes the correct diamond-cubic (DC) crystal structure. Nearest-neighbor interactions are incorporated to model the bonding, while the effects of a dislocation are incorporated by the addition of an energy field modeled as a core region and an elastic strained region. Dislocations are seen to nucleate the etching process and result in the formation of etch pits. Etch rates and etch-pit morphologies are investigated as a function of the chemical potential driving force for etching, the temperature, and the energy parameters used to model the dislocation.
Publication Title
MRS Proceedings
Recommended Citation
Woodraska, D. L.,
Lacosse, J.,
&
Jaszczak, J. A.
(1995).
Monte Carlo simulation of dislocation-nucleated etching of silicon {111} surfaces.
MRS Proceedings,
389, 209-214.
http://doi.org/10.1557/PROC-389-209
Retrieved from: https://digitalcommons.mtu.edu/physics-fp/17
Publisher's Statement
© 1995 Materials Research Society. Publisher's version of record: http://dx.doi.org/10.1557/PROC-389-209