Title

Superior analyzer for raman spectra with high acceptance cone, resolution, transmission, and quantum efficiency, and strong background reduction

Inventors

Manfred Fink
Philip Varghese
Jacek BorysowFollow

Files

Abstract

A Raman analyzer for analyzing light emitted from a Raman cell is provided that has a beam splitter configured to split the light emitted from the Raman cell into a first beam and a second beam. An atomic vapor filter can be used to filter a Raman scattered line from the first beam and a chopper system can periodically interrupt the first and second beams that are directed towards a photo detector, which can convert light from the first and second beams into an electrical signal. The signal output from the photo detector can optionally be amplified, digitized, Fourier filtered, and/or subjected to Fourier analysis.

Patent Number

US 8,384,894 B2

Assignee

Board of Regents of the University of Texas System, Austin, TX (US)

Assignee

Michigan Technological University, Houghton, MI (US)

Application Number

13/015,878

Date Filed

1-28-2011

Certificate of Correction

No

Issue Date

2-26-2013

Disciplines

Electrical and Computer Engineering | Engineering

Comments

For the most up-to-date information about this patent, including the availability of Certificates of Correction, be sure to check the United States Patent and Trademark Office's free, publicly accessible database: Patent Public Search https://ppubs.uspto.gov/pubwebapp/static/pages/landing.html

Recommended Citation

Fink, Manfred; Varghese, Philip; and Borysow, Jacek, "Superior analyzer for raman spectra with high acceptance cone, resolution, transmission, and quantum efficiency, and strong background reduction" (2013). Michigan Tech Patents. 118.
https://digitalcommons.mtu.edu/patents/118