Ice nucleation on hydrophilic silicon
Document Type
Article
Publication Date
4-14-2008
Abstract
We have used Fourier transform infrared spectroscopy to study thin water films on a hydrophilic silicon surface in the temperature range from 20 to -20 °C. Throughout that range, the spectra of the water adjacent to the silicon surface are consistent with that of bulk water near 25 °C. Thicker films (> 1 μm) freeze at -11±1 °C. We reconcile the apparent paradox of a thin film of water which is quite liquidlike at a temperature where freezing of thicker films occurs by hypothesizing that the nucleation event in the thicker film is triggered by a critical ice embryo which forms at some small distance from the silicon surface, as opposed to in direct contact with it. © 2008 American Institute of Physics.
Publication Title
Journal of Chemical Physics
Recommended Citation
Ochshorn, E.,
&
Cantrell, W.
(2008).
Ice nucleation on hydrophilic silicon.
Journal of Chemical Physics,
128(13).
http://doi.org/10.1063/1.2884351
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/8869