Atomic resolution study of local strains in doped VO < inf> 2 nanowires
Document Type
Conference Proceeding
Publication Date
8-1-2014
Publication Title
Microscopy and Microanalysis
Recommended Citation
Asayesh-Ardakani, H.,
Nie, A.,
Marley, P.,
Singh, S.,
Philips, P.,
Mashayek, F.,
Sambandamurthy, G.,
Low, K.,
Klie, R.,
Banerjee, S.,
Odegard, G.,
&
Shahbazian-Yassar, R.
(2014).
Atomic resolution study of local strains in doped VO < inf> 2 nanowires.
Microscopy and Microanalysis,
20(3), 1074-1075.
http://doi.org/10.1017/S1431927614007090
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/7771