Atomic resolution study of local strains in doped VO2 nanowires

Authors

• Hasti Asayesh-Ardakani, Michigan Technological University
• Anmin Nie, Michigan Technological University
• Peter M. Marley, University at Buffalo, The State University of New York
• Sujay Singh, University at Buffalo, The State University of New York
• Patrick J. Philips, University of Illinois at Chicago
• Farzad Mashayek, University of Illinois at Chicago
• Ganapathy Sambandamurthy, University at Buffalo, The State University of New York
• Ke Bin Low, University of Illinois at Chicago
• Robert F. Klie, University of Illinois at Chicago
• Sarbajit Banerjee, University at Buffalo, The State University of New York
• Gregory M. Odegard, Michigan Technological University
• Reza Shahbazian-Yassar, Michigan Technological University

Document Type

Conference Proceeding

Publication Date

8-1-2014

Publication Title

Microscopy and Microanalysis

Recommended Citation

Asayesh-Ardakani, H., Nie, A., Marley, P., Singh, S., Philips, P., Mashayek, F., Sambandamurthy, G., Low, K., Klie, R., Banerjee, S., Odegard, G., & Shahbazian-Yassar, R. (2014). Atomic resolution study of local strains in doped VO2 nanowires. Microscopy and Microanalysis, 20(3), 1074-1075. http://doi.org/10.1017/S1431927614007090
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/7771