In situ TEM monitoring of thermal decomposition in individual boron nitride nanotubes

Document Type

Article

Publication Date

4-17-2010

Department

Department of Mechanical Engineering-Engineering Mechanics; Department of Physics

Abstract

The future of microelectronic and nanoelectronics devices could lie in one-dimensional nanomaterials including boron nitride nanotubes (BNNTs). In such applications, however, the flow of electrical current may induce structural failure resulting in reduction of component Service life. Here, we utilized scanning tunneling microscopy inside a transmission electron microscope to study the thermal failure of individual multi-walled BNNTs via Joule heating. At elevated temperatures, the nanotube failed by the formation of amorphous nanoclusters and progression of structural defects. These Clusters have various sizes and initially form on the outermost shell layers of BNNTs.

Publisher's Statement

© TMS 2010. Publisher's version of record: https://doi.org/10.1007/s11837-010-0063-1

Publication Title

Journal of the Minerals, Metals & Materials Society

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