Structure and nanomechanical properties of CdTe thin films
Document Type
Article
Publication Date
3-3-2008
Department
Department of Mechanical Engineering-Engineering Mechanics
Abstract
CdTe thin films were produced by vacuum evaporation on glass sheets at substrate temperatures of 100 K and 300 K. The structural properties of the CdTe thin films were investigated through X-ray diffraction (XRD) technique and scanning electron microscopy (SEM). The mechanical properties (hardness, modulus and coating adhesion) were measured by nanoindentation and scratching techniques. XRD studies showed that the crystallinity of CdTe films improved with increasing substrate temperature. The grain size increased with the increase of substrate temperature and clearly facetted morphology was observed. The indentation hardness and modulus of CdTe thin films decreased with increasing grain size. The hardness and modulus increased gradually with increasing indentation depth due to the substrate effect. The adhesion of the coating increased with decreasing grain size.
Publication Title
Journal of Materials Processing Technology
Recommended Citation
Pürçek, G.,
Bacaksiz, E.,
&
Miskioglu, I.
(2008).
Structure and nanomechanical properties of CdTe thin films.
Journal of Materials Processing Technology,
198(1-3), 202-206.
http://doi.org/10.1016/j.jmatprotec.2007.07.005
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/6754
