Electrically-detected magnetic resonance near the p-doped/n-doped interface of Si junction diodes

Document Type

Article

Publication Date

6-17-1993

Department

Department of Physics

Abstract

Hyperfine structure has been observed in the electrically-detected magnetic resonance signal from a silicon p-n junction diode. By comparing the g value, hyperfine parameters, and bandgap energy level with known species having suitable abundances of isotopes with I = 1 2, the center is tentatively assigned as a platinum moiety, of presently undetermined structure. The observation indicates the usefulness of EDMR in the study of defects in ultrasmall Si devices, and raises certain questions regarding the current theories of spin-dependent recombination.

Publication Title

Colloids and Surfaces A: Physicochemical and Engineering Aspects

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