Microstructural evolution of protective La-Cr-O films studied by transmission electron microscopy
Document Type
Article
Publication Date
8-2006
Department
Department of Materials Science and Engineering
Abstract
Transmission Electron Microscopy (TEM) and Electron Energy Loss Spectroscopy (EELS) were performed to study the microstructural evolution of La-Cr-O thin films deposited by radio frequency (RF)-magnetron sputtering on stainless steel substrates. Chromium L edges and oxygen K edges are analyzed to determine the valence states of the chromium and elucidate the phase evolution of the thin film. The as-deposited amorphous thin film crystallized to LaCrO4 and finally transformed to the LaCrO3 stable phase during annealing at 800°C. An intermediate Cr/Mn oxide layer was formed in all annealed samples. The thickness of this oxide layer stabilizes after 700°C, which indicates that the LaCrO3 thin film plays a role in inhibiting the growth of an oxide layer on the metal surface.
Publication Title
Journal of Solid State Electrochemistry
Recommended Citation
Chi, M.,
Browning, N.,
&
Orlovskaya, N.
(2006).
Microstructural evolution of protective La-Cr-O films studied by transmission electron microscopy.
Journal of Solid State Electrochemistry,
10(8), 659-662.
http://doi.org/10.1007/s10008-006-0138-7
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/4785