Document Type
Article
Publication Date
7-9-2021
Abstract
Rare-earth barium-copper-oxide (REBCO) superconductors are high-field superconductors fabricated in a tape geometry that can be utilized in magnet applications well in excess of 20 T. Due to the multilayer architecture of the tape, delamination is one cause of mechanical failure in REBCO tapes. During a mechanical slitting step in the manufacturing process, edge cracks can be introduced into the tape. These cracks are thought to be potential initiation sites for crack propagation in the tapes when subjected to stresses in the fabrication and operation of magnet systems. We sought to understand which layers were the mechanically weakest by locating the crack initiation layer and identifying the geometrical conditions of the slitter that promoted or suppressed crack formation. The described cracking was investigated by selectively etching and characterizing each layer with scanning electron microscopy, laser confocal microscopy, and digital image analysis. Our analysis showed that the average crack lengths in the REBCO, LaMnO3 (LMO) and Al2O3 layers were 34 μm, 28 μm, and 15 μm, respectively. The total number of cracks measured in 30mmof wire length was between 3000 and 5700 depending on the layer and their crack densities were 102 cracks mm-1 for REBCO, 108 cracks mm-1 for LMO, and 183 cracks mm-1 for Al2O3. These results indicated that there are separate crack initiation mechanisms for the REBCO and the LMO layers, as detailed in the paper. With a better understanding of the crack growth behavior exhibited by REBCO tapes, the fabrication process can be improved to provide a more mechanically stable and cost-effective superconductor.
Publication Title
Engineering Research Express
Recommended Citation
Hartnett, W.,
Ramirez, J.,
Olson, T.,
Hopp, C.,
Jewell, M.,
Knoll, A.,
Hazelton, D.,
Zhang, Y.,
&
Olsen, T.
(2021).
Characterization of edge damage induced on REBCO superconducting tape by mechanical slitting.
Engineering Research Express,
3(3).
http://doi.org/10.1088/2631-8695/ac0fc3
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/15254
Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 International License.
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Publisher's PDF
Publisher's Statement
© 2021 The Author(s). Published by IOP Publishing Ltd. Publisher’s version of record: https://doi.org/10.1088/2631-8695/ac0fc3