Extended-sampling-bayesian method for limited aperture inverse scattering problems
Document Type
Article
Publication Date
1-1-2019
Abstract
© by SIAM. Unauthorized reproduction of this article is prohibited. Limited aperture inverse scattering problems arise in many important applications. In this paper, we propose a new method combining the extended sampling method (ESM) and the Bayesian approach for the inverse acoustic scattering problem to reconstruct the shape of a sound-soft obstacle using the limited aperture data. The problem is formulated as a statistical model using the Bayes formula. The well-posedness is proved in the sense of the Hellinger metric. A modified ESM is proposed to obtain the obstacle location, which is critical to the convergence of the MCMC algorithm. An extensive numerical study is presented to illustrate the performance of the method.
Publication Title
SIAM Journal on Imaging Sciences
Recommended Citation
Li, Z.,
Deng, Z.,
&
Sun, J.
(2019).
Extended-sampling-bayesian method for limited aperture inverse scattering problems.
SIAM Journal on Imaging Sciences,
13(1), 422-444.
http://doi.org/10.1137/19M1270501
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/12339