Optical waveguide end roughness in correlation to optical coupling
Document Type
Conference Proceeding
Publication Date
3-27-2012
Abstract
With the ever-increasing demand for board-to-board optical data communications, the correlation between waveguide surface end roughness and coupling losses must be thoroughly investigated. This study measures end roughness of siloxane polymer optical waveguides in terms of optical coupling losses. Siloxane Polymers from Dow Corning were used to fabricate 50 x 50 ?m rectangular waveguides through photolithographic processes. Edge roughness was controlled through various grades of fiber-optic polishing films and then measured using interferometric microscopy (IFM). Controlled lab results are compared with industrial polishing techniques that are consistent with mass-production methods. Electromagnetic modeling revealed correlations between experimental and theoretical results. © 2012 SPIE.
Publication Title
Proceedings of SPIE - The International Society for Optical Engineering
Recommended Citation
Kruse, K.,
Riegel, N.,
Demars, C.,
Middlebrook, C.,
&
Roggemann, M.
(2012).
Optical waveguide end roughness in correlation to optical coupling.
Proceedings of SPIE - The International Society for Optical Engineering,
8267.
http://doi.org/10.1117/12.908847
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/12170