Analysis of Grain‐Boundary Impurities and Fluoride Additives in Hot‐Pressed Oxides by Auger Electron Spectroscopy
Auger electron spectroscopy was used to characterize grain‐boundary chemistry in MgO, Al2O3, and MgAl2O4 (spinel) hot‐pressed with LiF or NaF. The presence of additives (F, Na) at the grain boundaries was confirmed; observation of grain‐boundary impurities in MgO extends previous studies. Copyright © 1974, Wiley Blackwell. All rights reserved
Journal of the American Ceramic Society
Analysis of Grain‐Boundary Impurities and Fluoride Additives in Hot‐Pressed Oxides by Auger Electron Spectroscopy.
Journal of the American Ceramic Society,
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