Title

Micromorphology analysis of sputtered indium tin oxide fabricated with variable ambient combinations

Authors

Ştefan Ţălu, Technical University of Cluj-Napoca
Slawomir Kulesza, University of Warmia
Miroslaw Bramowicz, University of Warmia
Adam Pringle, Michigan Technological University
Joshua M. Pearce, Michigan Technological UniversityFollow
Marikkannan Murugesan, Madurai Kamaraj University
Vishnukanthan Venkatachalapathy, University of Oslo
J. Mayandi, Madurai Kamaraj University

Document Type

Article

Publication Date

3-2018

Abstract

This study experimentally investigates the fractal nature of DC magnetron sputtered indium-tin oxide (ITO) fabricated utilizing mixed ambient combinations and post-annealed at 450 °C in air towards solar cell applications. The structural properties of the films were examined by X-ray diffraction technique. In addition, three-dimensional (3-D) surface morphology of the films was analyzed using the areal autocorrelation function and pseudo-topothesy K for the atomic force microscopy images. The fractal nature of films was co-related with respect to electrical and optical properties of ITO films prepared under five different ambient conditions.

Publisher's Statement

© 2018 Elsevier B.V. All rights reserved. Publisher's version of record: https://doi.org/10.1016/j.matlet.2018.03.005

Publication Title

Materials Letters

Recommended Citation

Ţălu, Ş., Kulesza, S., Bramowicz, M., Pringle, A., Pearce, J. M., Murugesan, M., Venkatachalapathy, V., & Mayandi, J. (2018). Micromorphology analysis of sputtered indium tin oxide fabricated with variable ambient combinations. Materials Letters, 220, 169-171. http://doi.org/10.1016/j.matlet.2018.03.005
Retrieved from: https://digitalcommons.mtu.edu/materials_fp/182