Download Full Text (283 KB)


A Raman analyzer for analyzing light emitted from a Raman cell is provided that has a beam splitter configured to split the light emitted from the Raman cell into a first beam and a second beam. An atomic vapor filter can be used to filter a Raman scattered line from the first beam and a chopper system can periodically interrupt the first and second beams that are directed towards a photo detector, which can convert light from the first and second beams into an electrical signal. The signal output from the photo detector can optionally be amplified, digitized, Fourier filtered, and/or subjected to Fourier analysis.

Patent Number

US 8,384,894 B2


Board of Regents of the University of Texas System, Austin, TX (US)


Michigan Technological University, Houghton, MI (US)

Application Number


Date Filed


Certificate of Correction


Issue Date



Electrical and Computer Engineering | Engineering


For the most up-to-date information about this patent, including the availability of Certificates of Correction, be sure to check the United States Patent and Trademark Office's free, publicly accessible database: Patent Public Search

Superior analyzer for raman spectra with high acceptance cone, resolution, transmission, and quantum efficiency, and strong background reduction



To view the content in your browser, please download Adobe Reader or, alternately,
you may Download the file to your hard drive.

NOTE: The latest versions of Adobe Reader do not support viewing PDF files within Firefox on Mac OS and if you are using a modern (Intel) Mac, there is no official plugin for viewing PDF files within the browser window.