A four-point surface conductivity probe suitable for in situ ultrahigh vacuum conductivity measurements

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A simple design for a four-point probe suitable for precision surface conductivity measurements is described. Our design makes use of small, commercially available spring contact probes which are mounted in a custom built MACOR ceramic probe head. The design is suitable for use in ultrahigh vacuum applications, and the custom-built parts can be fabricated in any machine shop. Very reproducible values were obtained using this probe for surface conductivity measurements on a MoS2(0001) model catalyst, a sputter deposited indium-tin oxide thin film and a doped silicon wafer. ©1997 American Institute of Physics.

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Review of Scientific Instruments