In situ TEM monitoring of thermal decomposition in individual boron nitride nanotubes
Document Type
Article
Publication Date
4-17-2010
Department
Department of Mechanical Engineering-Engineering Mechanics; Department of Physics
Abstract
The future of microelectronic and nanoelectronics devices could lie in one-dimensional nanomaterials including boron nitride nanotubes (BNNTs). In such applications, however, the flow of electrical current may induce structural failure resulting in reduction of component Service life. Here, we utilized scanning tunneling microscopy inside a transmission electron microscope to study the thermal failure of individual multi-walled BNNTs via Joule heating. At elevated temperatures, the nanotube failed by the formation of amorphous nanoclusters and progression of structural defects. These Clusters have various sizes and initially form on the outermost shell layers of BNNTs.
Publication Title
Journal of the Minerals, Metals & Materials Society
Recommended Citation
Ghassemi, H. M.,
Lee, C. H.,
Yap, Y. K.,
&
Shahbazian-Yassar, R.
(2010).
In situ TEM monitoring of thermal decomposition in individual boron nitride nanotubes.
Journal of the Minerals, Metals & Materials Society,
62(4), 69-73.
http://doi.org/10.1007/s11837-010-0063-1
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/73
Publisher's Statement
© TMS 2010. Publisher's version of record: https://doi.org/10.1007/s11837-010-0063-1