Extended sampling method for inverse elastic scattering problems using one incident wave


J. Liu
X. Liu
J. Sun

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Department of Mathematical Sciences


We consider the inverse elastic scattering problems using the far field data due to one incident plane wave. A simple method is proposed to reconstruct the location and size of the obstacle using different components of the far field pattern. The method sets up linear ill-posed integral equations for sampling points in the domain of interrogation and uses the (approximate) solutions to compute indicators. Using the far field patterns of rigid disks as the kernels of the integral equations and moving the measured data to the right-hand side, the method has the ability to process limited aperture data. Numerical examples show that the method can effectively determine the location and approximate the support of the obstacle with little a priori information.

Publisher's Statement

© 2019, Society for Industrial and Applied Mathematics. Publisher’s version of record: https://doi.org/10.1137/19M1237788

Publication Title

SIAM Journal on Imaging Sciences