Title
Atomic Force Microscopy for Characterization of Surfaces, Particles, and Their Interactions
Document Type
Article
Publication Date
12-1-2012
Publication Title
Developments in Surface Contamination and Cleaning: Detection, Characterization, and Analysis of Contaminants
Recommended Citation
Etzler, F.,
&
Drelich, J.
(2012).
Atomic Force Microscopy for Characterization of Surfaces, Particles, and Their Interactions.
Developments in Surface Contamination and Cleaning: Detection, Characterization, and Analysis of Contaminants, 307-331.
http://doi.org/10.1016/B978-1-4377-7883-0.00006-7
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/5864
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