A highly sensitive noncontacting electromagnetic device for detecting dynamic stress in structures
Department of Electrical and Computer Engineering
A highly sensitive, noncontacting electromagnetic device has been developed to detect stress waves in structures. It is shown that for detecting an induced strain this device is over 500 times more sensitive than conventional bonded strain gages. The principle of detecting the strain by this device is based on the fact that dynamic stresses in a structure induce similar stresses in a bonded piezoelectric material. This, in turn, creates a magnetic field which extends beyond the material itself. An electromagnetic device has been built to detect this magnetic field and thus monitor the dynamic stresses. This method provides a noncontacting means of measuring strain in structures with improved sensitivity.
A highly sensitive noncontacting electromagnetic device for detecting dynamic stress in structures.
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/4364