A highly sensitive noncontacting electromagnetic device for detecting dynamic stress in structures
Document Type
Article
Publication Date
12-1983
Department
Department of Electrical and Computer Engineering
Abstract
A highly sensitive, noncontacting electromagnetic device has been developed to detect stress waves in structures. It is shown that for detecting an induced strain this device is over 500 times more sensitive than conventional bonded strain gages. The principle of detecting the strain by this device is based on the fact that dynamic stresses in a structure induce similar stresses in a bonded piezoelectric material. This, in turn, creates a magnetic field which extends beyond the material itself. An electromagnetic device has been built to detect this magnetic field and thus monitor the dynamic stresses. This method provides a noncontacting means of measuring strain in structures with improved sensitivity.
Publication Title
Experimental Mechanics
Recommended Citation
Reddy, G.,
&
Saha, S.
(1983).
A highly sensitive noncontacting electromagnetic device for detecting dynamic stress in structures.
Experimental Mechanics,
23(4), 418-424.
http://doi.org/10.1007/BF02330058
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/4364
Publisher's Statement
© 1983 Society for Experimental Mechanics, Inc. Publisher’s version of record: https://doi.org/10.1007/BF02330058