Scratch resistance and residual stresses in longitudinally and transversely ground silicon nitride

Document Type

Conference Proceeding

Publication Date



An instrumented scratch tester is utilized to investigate the scratch resistance of surface ground silicon nitride. Single-grit scratches were conducted, both in longitudinal and transverse direction to grinding. The volume of material removed during the scratch event and the measured force were utilized to quantify the scratch resistance and then estimate the bounds for ductile to brittle transition limits for material removal. Residual stress measurements and the scratch resistance were rationalized based on the induced damage features.

Publication Title

Ceramic Engineering and Science Proceedings