In-situ FTIR-DRS investigation on shallow trap state of Cu-doped TiO2 photocatalyst

Authors

Lihong Zhang, Tianjin University
Bing Han, Michigan Technological University
Peifu Cheng, Michigan Technological University
Yun Hang Hu, Michigan Technological UniversityFollow

Document Type

Article

Publication Date

2-1-2020

Department

Department of Materials Science and Engineering

Abstract

It is important to characterize photocatalysts by in-situ techniques. In this work, the high pressure temperature-programmed in-situ Fourier Transform Infrared Diffuse Reflection Spectroscopy (FTIR-DRS) was employed to evaluate shallow trap states in Cu-doped TiO₂ photocatalyst. It was demonstrated that the formation of the shallow trap state by reduction is much easier for CuO/TiO₂ than pure TiO₂. Furthermore, the formation temperature of the shallow trap state for CuO/TiO₂ is the same as its starting reduction temperature of Cu²⁺ to Cu⁺, which indicates that the generated shallow trap state might be Cu⁺.

Publication Title

Catalysis Today

Recommended Citation

Zhang, L., Han, B., Cheng, P., & Hu, Y. H. (2020). In-situ FTIR-DRS investigation on shallow trap state of Cu-doped TiO2 photocatalyst. Catalysis Today, 341, 21-25. http://doi.org/10.1016/j.cattod.2018.06.049
Retrieved from: https://digitalcommons.mtu.edu/michigantech-p/1387