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Abstract

A Raman analyzer for analyzing light emitted from a Raman cell is provided that has a beam splitter configured to split the light emitted from the Raman cell into a first beam and a second beam. An atomic vapor filter can be used to filter a Raman scattered line from the first beam and a chopper system can periodically interrupt the first and second beams that are directed towards a photo detector, which can convert light from the first and second beams into an electrical signal. The signal output from the photo detector can optionally be amplified, digitized, Fourier filtered, and/or subjected to Fourier analysis.

Patent Number

8,384,894

Assignee

Board of Regents of the University of Texas System, Austin, TX (US); Michigan Technological University, Houghton, MI (US)

Application Number

13/015,878

Date Filed

1-28-2011

Certificate of Correction

No

Issue Date

2-26-2013

Disciplines

Electrical and Computer Engineering | Engineering

Superior analyzer for raman spectra with high acceptance cone, resolution, transmission, and quantum efficiency, and strong background reduction

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